SEM (Scanning Electron Microscope) and AFM (Atomic Force Microscope)
Morphological imaging is performed at high magnification rates (40,000x) using the Scanning Electron Microscope (SEM). Additionally, high-resolution color images can be obtained at magnification rates of 600x-1000x using a computer-aided light microscope.
Analysis Requests:
The analysis request form must be filled out and submitted to the Physics Department Secretariat.
Upon approval of the request, the bank receipt confirming the payment (based on the analysis type) and the sample (prepared in accordance with the analysis application form) must be provided.
Contact Information:
Instrument Supervisor: Prof. Dr. Sertan Kemal AKAY
E-mail: kakay@uludag.edu.tr
Phone: (0224) 294 1719
Instrument Supervisor: Prof. Dr. Özer YILMAZ (Department of Biology)
E-mail: ozery@uludag.edu.tr
Phone: (0224) 294 2865
Sample Submission:
E-mail: fizikbolsek@uludag.edu.tr
Phone: (0224) 294 1690
2025 Analysis Fees
|
Service Type
|
Service Fee*
|
|
Sample Preparation (Drying) (SEM)
|
850 ₺
|
|
Sample Coating with Gold-Palladium (SEM)
|
750 ₺
|
|
Sample Examination (20 Minutes Per Sample) (SEM)
|
1300 ₺
|
|
AFM Analysis (Dynamic Mode)
|
1500 ₺
|
|
Stereo Microscope Analysis (Sampling, Examination, and Imaging)**
|
950 ₺ / Hour
|
|
Industrial Microscope Analysis (Sampling, Examination, and Imaging)**
|
950 ₺ / Hour
|
* VAT (20%) is not included in the service fees.
** Specified service fees are per hour.
SEM and AFM Images: